SnS2 - Full Area Few-layer on c-cut Sapphire

This product contains full area coverage SnS₂ on c-cut sapphire substrates. Sample size measures 1cm in size and the entire sample surface contains thick SnS₂ sheet. Synthesized full area coverage SnS₂ is highly crystalline. SnS2 sheets are highly unstable in monolayer form thus our products are delivered in few-layer form at desired thickness values.

Growth method: Our company synthesizes these monolayers using chemical vapor deposition (CVD) using highest purity (6N) gases and precursors in semiconductor grade facilities to produce crystalline and large domain size samples (1-50um). This is unlike commonly used MOCVD process wherein defects are very very large and domain sizes are small (10nm-500nm). 

Sample Properties

Specification.

• Identification. Full coverage 100% SnS₂ uniformly covered across c-cut sapphire
• Physical dimensions. one centimeter in size. Larger sizes up to 2-inch wafer-scale available upon requests.
• Smoothness. Atomically smooth surface with roughness < 0.15 nm.
• Uniformity. Highly uniform surface morphology. SnS₂ uniformly cover across the sample.
• Purity. 99.9995% purity as determined by nano-SIMS measurements
• Reliability. Repeatable Raman and photoluminescence response
• Substrate. c-cut Sapphire but our research and development team can transfer SnS₂ onto variety of substrates including PET, quartz, and SiO2/Si
• Support. 2Dsemiconductors USA is an American owned, regulated, and operated company. Our customers are well-protected by international as well as strict American customer laws and regulations. We give full technical support and guarantee your satisfaction with our well-established customer
• Defect profile. SnS₂ do not contain intentional dopants or defects. However, our technical staff can produce defected SnS₂ using a-bombardment technique.