Description
This product contains full area coverage WSe2 few-layers that measure 3-5 layers in thickness. Sheets are grown through chemical vapor deposition technique onto c-cut double side polished sapphire substrates, but layers can be transferred onto other substrates by polymer assisted transfer technique on demand (please select from the drop down menu). The sample measures 1cm2 in size and the entire sample surface contains few-layer thick WSe2 sheet. Grown few-layers are high-crystalline as evidenced by HR-TEM, Raman, EDS, and XRD measurements.
Growth method: Our company synthesizes these few layers using chemical vapor deposition (CVD) using highest purity (6N) gases and precursors in semiconductor grade facilities to produce crystalline and large domain size samples (1-50um). Other sources typically use MOCVD or sputtering process wherein defects are very large, domain sizes are small (10nm-500nm), and products are non-layered. Our samples are always highly crystallized, high purity, and perfectly layered.
Sample Properties
| Sample size | 1cm x 1cm in size |
| Substrate type | (0001) c-cut sapphire (other substrates on request) |
| Coverage | Full coverage few-layers that measure 3-5 layers |
| Electrical properties | Semiconductor |
| Crystal structure | Hexagonal Phase |
| Unit cell parameters | a = b = 0.327 nm, c = 1.295 nm, α = β = 90°, γ = 120° |
| Production method | Low pressure Chemical Vapor Deposition (LPCVD) |
| Characterization methods | Raman, photoluminescence, TEM, EDS |
Additional Information
Elements: |
W,Se |
Formula: |
WSe2 |
Substrate: |
Sapphire |
Substrate: |
SiO2/Si |
Substrate: |
Quartz |
Substrate: |
ITO |
Substrate: |
PET |
Substrate: |
Custom |
Element: |
Tungsten |
Element: |
Selenium |
Properties: |
Semiconductor |
Material class: |
Dichalcogen |
Thin-film type: |
Few-layer |
Growth method: |
CVD |
