SnSe2 - Full Area Monolayer on c-cut Sapphire

This product contains full area coverage SnSe₂ monolayers on c-cut sapphire substrates. Sample size measures 1cm in size and the entire sample surface contains monolayer thick SnSe₂ sheet. Synthesized full area coverage monolayer SnSe₂ is highly crystalline. 

Growth method: Our company synthesizes these monolayers using chemical vapor deposition (CVD) using highest purity (6N) gases and precursors in semiconductor grade facilities to produce crystalline and large domain size samples (1-50um). This is unlike commonly used MOCVD process wherein defects are very very large and domain sizes are small (10nm-500nm). 

Sample Properties

Specification.

• Identification. Full coverage 100% monolayer SnSe₂ uniformly covered across c-cut sapphire
• Physical dimensions. one centimeter in size. Larger sizes up to 2-inch wafer-scale available upon requests.
• Smoothness. Atomically smooth surface with roughness < 0.15 nm.
• Uniformity. Highly uniform surface morphology. SnSe₂ monolayers uniformly cover across the sample.
• Purity. 99.9995% purity as determined by nano-SIMS measurements
• Reliability. Repeatable Raman and photoluminescence response
• Crystallinity. High crystalline quality, Raman response, and photoluminescence emission comparable to single crystalline monolayer flakes.
• Substrate. c-cut Sapphire but our research and development team can transfer SnSe₂ monolayers onto variety of substrates including PET, quartz, and SiO2/Si without significant compromisation of material quality.
• Support. 2Dsemiconductors USA is an American owned, regulated, and operated company. Our customers are well-protected by international as well as strict American customer laws and regulations. We give full technical support and guarantee your satisfaction with our well-established customer
• Defect profile. SnSe₂ monolayers do not contain intentional dopants or defects. However, our technical staff can produce defected SnSe₂ using a-bombardment technique.